학제간연구 | Interdisciplinary Studies in Gambling | 跨学科研究
- date : 2015-05-20 01:10|hit : 1440
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- Article] Energy-filtered electron backscatter diffraction
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DocNo of ILP: 4027
Doc. Type: Article
Title: Energy-filtered electron backscatter diffraction
Authors: Deal, A; Hooghan, T; Eades, A
Full Name of Authors: Deal, Andrew; Hooghan, Tejpal; Eades, Alwyn
Keywords by Author: electron backscatter diffraction (EBSD); energy filter; Kikuchi bands
Keywords Plus: MONTE-CARLO CODE; C-LANGUAGE; SEM; SIMULATION; CASINO
Abstract: The electron backscatter diffraction (EBSD) analytical technique is invaluable for determining the crystallography of bulk alloys, thin films, and nanoparticles. However, our physical understanding of EBSD pattern generation is incomplete, which hinders our ability to push the limits of EBSD analysis. Here, using an energy filter with better than 10eV resolution, we experimentally demonstrate the energy dependence of EBSD patterns from elements over a large atomic number range. We verify that low-loss electrons are the major contributors to EBSD patterns, but that there is still a diffraction contribution from electrons with only 80% of the incident beam energy. Additionally, the bands in filtered EBSD patterns have contrast that is more than twice the contrast of their unfiltered counterparts. The band contrast reaches a maximum for a cutoff energy in the filter of about 3% below the energy of the incident beam. Different mechanisms are used to explain the drop in contrast on each side of the maximum. With the cutoff set very close to the energy of the incident beam, the patterns become more blurred. We used a Monte Carlo simulation in the analysis of these experiments. (c) 2007 Elsevier B.V. All rights reserved.
Cate of OECD: Other engineering and technologies
Year of Publication: 2008
Business Area: casino
Detail Business: casino
Country: Netherlands
Study Area:
Name of Journal: ULTRAMICROSCOPY
Language: English
Country of Authors: [Deal, Andrew; Hooghan, Tejpal; Eades, Alwyn] GE Global Res, Nisakayuna, NY 12309 USA
Press Adress: Deal, A (reprint author), GE Global Res, 1 Res Circle, Nisakayuna, NY 12309 USA.
Email Address: deal@research.ge.com
Citaion:
Funding:
Lists of Citation: Baba-Kishi KZ, 2002, J MATER SCI, V37, P1715, DOI 10.1023/A:1014964916670; Berger D, 2002, SCANNING, V24, P70; Burden R.L., 1997, NUMERICAL ANAL, P1997; Deal A, 2005, SURF INTERFACE ANAL, V37, P1017, DOI 10.1002/sia.2115; Dingley D, 2004, J MICROSC-OXFORD, V213, P214, DOI 10.1111/j.0022-2720.2004.01321.x; Drouin D, 1997, SCANNING, V19, P20; HOOGHAN T, 2004, MICROSC MICROANAL, V10, P938; Hovington P, 1997, SCANNING, V19, P1; Humphreys FJ, 2001, J MATER SCI, V36, P3833, DOI 10.1023/A:1017973432592; Joy D.C., 1995, M CARLO MODELING ELE; MANCUSO JF, 1994, PROC ANN MEET MSA, P604; Prior DJ, 1999, AM MINERAL, V84, P1741; Ren SX, 1998, MICROSC MICROANAL, V4, P15; WELLS OC, 1979, SCANNING ELECT MICRO; Williams D. B., 1996, TRANSMISSION ELECTRO
Number of Citaion: 15
Publication: ELSEVIER SCIENCE BV
City of Publication: AMSTERDAM
Address of Publication: PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
ISSN: 0304-3991
29-Character Source Abbreviation: ULTRAMICROSCOPY
ISO Source Abbreviation: Ultramicroscopy
Volume: 108
Version: 2
Start of File: 116
End of File: 125
DOI: 10.1016/j.ultramic.2007.03.010
Number of Pages: 10
Web of Science Category: Microscopy
Subject Category: Microscopy
Document Delivery Number: 257RT
Unique Article Identifier: WOS:000252816900005
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